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dc.contributor.authorChang, Meng-Fanen_US
dc.contributor.authorLin, Chien-Chenen_US
dc.contributor.authorLee, Alberten_US
dc.contributor.authorChiang, Yen-Ningen_US
dc.contributor.authorKuo, Chia-Chenen_US
dc.contributor.authorYang, Geng-Hauen_US
dc.contributor.authorTsai, Hsiang-Jenen_US
dc.contributor.authorChen, Tien-Fuen_US
dc.contributor.authorSheu, Shyh-Shyuanen_US
dc.date.accessioned2018-08-21T05:54:04Z-
dc.date.available2018-08-21T05:54:04Z-
dc.date.issued2017-06-01en_US
dc.identifier.issn0018-9200en_US
dc.identifier.urihttp://dx.doi.org/10.1109/JSSC.2017.2681458en_US
dc.identifier.urihttp://hdl.handle.net/11536/145558-
dc.description.abstractExisting nonvolatile ternary content-addressable-memory (nvTCAM) suffers from limited word-length (WDL), large write-energy (E-W) and search-energy (E-S), and large cell area (A). This paper develops a 3T1R nvTCAM cell using a single multiple-level cell (MLC)-resistive RAM (ReRAM) device to achieve long WDL, lower E-W and E-S, and reduced cell area. Two peripheral control schemes were developed, dual-replica-row self-timed and invalid-entry power consumption suppression (IEPCS), for the suppression of dc current in 3T1R nvTCAM cells in order to reduce E-S. Two versions of the IEPCS scheme were developed (basic and charge-recycle-controlled) to alter the tradeoff between area overhead and power consumption in the updating of invalid-bits. A 128 b x 64 b 3T1R nvTCAM macro was fabricated using back-end-of-line ReRAM under 90-nm CMOS process. The fabricated MLC-based 3T1R nvTCAM macro achieved sub-1-ns search-delay and sub-6-ns wake-up time with supply voltage of 1 V and WDL = 64 b.en_US
dc.language.isoen_USen_US
dc.subjectNonvolatile memory (NVM)en_US
dc.subjectnonvolatile ternary content-addressable-memory (nvTCAM)en_US
dc.subjectresistive RAM (ReRAM)en_US
dc.subjectTCAMen_US
dc.titleA 3T1R Nonvolatile TCAM Using MLC ReRAM for Frequent-Off Instant-On Filters in IoT and Big-Data Processingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/JSSC.2017.2681458en_US
dc.identifier.journalIEEE JOURNAL OF SOLID-STATE CIRCUITSen_US
dc.citation.volume52en_US
dc.citation.spage1664en_US
dc.citation.epage1679en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000402179800016en_US
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