完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Fan, Yen-Ting | en_US |
dc.contributor.author | Lo, Ming-Cheng | en_US |
dc.contributor.author | Wu, Chu-Chun | en_US |
dc.contributor.author | Chen, Peng-Yu | en_US |
dc.contributor.author | Wu, Jenq-Shinn | en_US |
dc.contributor.author | Liang, Chi-Te | en_US |
dc.contributor.author | Lin, Sheng-Di | en_US |
dc.date.accessioned | 2019-04-03T06:43:05Z | - |
dc.date.available | 2019-04-03T06:43:05Z | - |
dc.date.issued | 2017-07-01 | en_US |
dc.identifier.issn | 2158-3226 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.4991435 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/145866 | - |
dc.description.abstract | Atomic-scale metal films exhibit intriguing size-dependent film stability, electrical conductivity, superconductivity, and chemical reactivity. With advancing methods for preparing ultra-thin and atomically smooth metal films, clear evidences of the quantum size effect have been experimentally collected in the past two decades. However, with the problems of small-area fabrication, film oxidation in air, and highly-sensitive interfaces between the metal, substrate, and capping layer, the uses of the quantized metallic films for further ex-situ investigations and applications have been seriously limited. To this end, we develop a large-area fabrication method for continuous atomic-scale aluminum film. The self-limited oxidation of aluminum protects and quantizes the metallic film and enables ex-situ characterizations and device processing in air. Structure analysis and electrical measurements on the prepared films imply the quantum size effect in the atomic-scale aluminum film. Our work opens the way for further physics studies and device applications using the quantized electronic states in metals. (C) 2017 Author(s). | en_US |
dc.language.iso | en_US | en_US |
dc.title | Atomic-scale epitaxial aluminum film on GaAs substrate | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.4991435 | en_US |
dc.identifier.journal | AIP ADVANCES | en_US |
dc.citation.volume | 7 | en_US |
dc.citation.issue | 7 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000406760200051 | en_US |
dc.citation.woscount | 2 | en_US |
顯示於類別: | 期刊論文 |