完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Weng, Chun-Jen | en_US |
dc.contributor.author | Lu, Bo-Rong | en_US |
dc.contributor.author | Cheng, Pi-Ying | en_US |
dc.contributor.author | Hwang, Chi-Hung | en_US |
dc.contributor.author | Chen, Chih-Yen | en_US |
dc.date.accessioned | 2018-08-21T05:56:22Z | - |
dc.date.available | 2018-08-21T05:56:22Z | - |
dc.date.issued | 2017-01-01 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/146140 | - |
dc.description.abstract | this paper reports on a confocal displacement sensor with varifocal lens used to measure the thickness of transparent materials. The focal length of the varifocal lens is adjusted by varying the current. Laser light passing through a transparent target lying within the range of the focal length crosses two interfaces; i.e., first from air to glass and then from glass to air. The signals associated with the interface were of higher intensity than that measure at other points along the z axis. A power meter is used to measure the power and LabVIEW is used to record a power-current graph. The current gap between the two peaks can be translated into values of displacement, indicating the thickness of the material. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | confocal | en_US |
dc.subject | thickness | en_US |
dc.subject | varifocal lens | en_US |
dc.title | Measuring the thickness of transparent objects using a confocal displacement sensor | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2017 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) | en_US |
dc.citation.spage | 1531 | en_US |
dc.citation.epage | 1535 | en_US |
dc.contributor.department | 機械工程學系 | zh_TW |
dc.contributor.department | Department of Mechanical Engineering | en_US |
dc.identifier.wosnumber | WOS:000431839600270 | en_US |
顯示於類別: | 會議論文 |