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dc.contributor.authorTsai, Chang-Linen_US
dc.contributor.authorCheng, Chao-Weien_US
dc.contributor.authorHuang, Ning-Chien_US
dc.contributor.authorWu, Kai-Chiangen_US
dc.date.accessioned2018-08-21T05:56:48Z-
dc.date.available2018-08-21T05:56:48Z-
dc.date.issued2017-01-01en_US
dc.identifier.issn1530-1591en_US
dc.identifier.urihttp://hdl.handle.net/11536/146675-
dc.description.abstractCircuit performance has been the key design constraint for over a decade. Variable-latency design (VLD) paradigm was proposed for optimizing the overall performance in terms of throughput. In addition, process variations and aging effects manifest themselves as gate delay shifts, and in turn cause variability of circuit timing (timing variability). Required for dealing with the impact of timing variability better, detailed evaluation and analysis of circuit timing for VIM are actually not straightforward. In this paper, we present a systematic methodology for analyzing a VLD circuit, and identifying critical 1-cycle and 2-cycle paths/gates. Based on the criticality analysis, a gate sizing framework using particle swarm optimization (PSO) is proposed. Our objective is, in a less pessimistic fashion, making constructed VLD circuits better (less vulnerable to timing variability). The proposed framework is experimentally verified to be runtime-efficient and able to provide promising results. On average, an extra timing margin of 11% can be obtained without lengthening the clock period, and only 4% area overhead is introduced.en_US
dc.language.isoen_USen_US
dc.titleAnalysis and Optimization of Variable-Latency Designs in the Presence of Timing Variabilityen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF THE 2017 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)en_US
dc.citation.spage1219en_US
dc.citation.epage1224en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000404171500226en_US
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