完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Liu, Sean Shih-Ying | en_US |
dc.contributor.author | Luo, Ren-Guo | en_US |
dc.contributor.author | Chen, Hung-Ming | en_US |
dc.date.accessioned | 2018-08-21T05:56:55Z | - |
dc.date.available | 2018-08-21T05:56:55Z | - |
dc.date.issued | 2013-01-01 | en_US |
dc.identifier.issn | 1530-1591 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/146842 | - |
dc.description.abstract | In this paper, we propose a power density mitigation algorithm at post-placement stage. Our proposed framework first identifies cluster of bins with high temperature, then propagates power density away from high temperature region by balancing regional power density. The problem of balancing regional power density is modeled as a supply-demand problem and solution is obtained with minimal displacement of cells. An analytical temperature profiling algorithm is tightly integrated within the framework to constantly update the temperature profile in response to incremental perturbation to placement. Our proposed approach can effectively reduce maximum temperature compared to previous works on temperature mitigation. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A Network-Flow Based Algorithm For Power Density Mitigation at Post-Placement Stage | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | DESIGN, AUTOMATION & TEST IN EUROPE | en_US |
dc.citation.spage | 1707 | en_US |
dc.citation.epage | 1710 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000415129400329 | en_US |
顯示於類別: | 會議論文 |