Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chiou, Jin-Chern | en_US |
dc.contributor.author | Yang, Tzu-Sen | en_US |
dc.contributor.author | Tsai, Shang-Wei | en_US |
dc.date.accessioned | 2018-08-21T05:57:14Z | - |
dc.date.available | 2018-08-21T05:57:14Z | - |
dc.date.issued | 2017-01-01 | en_US |
dc.identifier.issn | 2151-1225 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/147207 | - |
dc.description.abstract | This paper proposes a novel method to clearly differentiate the distinct problems of temperature and IR drop inside a chip. This method involves the placement of two same ring-oscillator-based sensors in specific areas. Simulation results show that as temperature increases, the digital counter output of the ring-oscillator-based sensor decreases. Alternatively, a decrease in the power supply decreases the digital output of the ring-oscillator-based sensor. Results also show that when the digital circuit speed was slow, the difference between the digital count outputs of the two sensors became very small; this difference was very large when the speed was high. Thus, the difference between the digital count outputs of the two sensors represents the internal power status of the chip. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | ring oscillator | en_US |
dc.subject | temperature sensor | en_US |
dc.subject | ir drop | en_US |
dc.subject | 3d ic | en_US |
dc.title | Novel Application of Ring-oscillator-based Sensor for 3D IC Temperature and IR Drop Monitoring | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2017 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS SYMPOSIUM (EDAPS) | en_US |
dc.contributor.department | 電機工程學系 | zh_TW |
dc.contributor.department | Department of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000428157200121 | en_US |
Appears in Collections: | Conferences Paper |