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dc.contributor.authorLee, CPen_US
dc.contributor.authorLiu, DCen_US
dc.date.accessioned2014-12-08T15:02:52Z-
dc.date.available2014-12-08T15:02:52Z-
dc.date.issued1996-02-01en_US
dc.identifier.issn0169-4332en_US
dc.identifier.urihttp://dx.doi.org/10.1016/0169-4332(95)00288-Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/1477-
dc.description.abstractDamage free quantum dots have been fabricated directly using molecular beam epitaxy. Excellent photoluminescence has been obtained and is attributed to the absence of the non-radiative recombination centers and the enhanced oscillator strength for exciton recombination due to the confinement of quantum dots. The size variation of the quantum dots has been estimated from the width of the emission peak of low temperature photoluminescence (PL). A variation of only +/- 10 Angstrom is obtained. The existence of the quantum dots has also been verified directly from the image of the dots using atomic force microscopy. The image sizes of the quantum dots agree with that estimated from the PL blue shift.en_US
dc.language.isoen_USen_US
dc.titleHigh quality quantum dots fabricated by molecular beam epitaxyen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/0169-4332(95)00288-Xen_US
dc.identifier.journalAPPLIED SURFACE SCIENCEen_US
dc.citation.volume92en_US
dc.citation.issueen_US
dc.citation.spage519en_US
dc.citation.epage525en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1996UG56100096-
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