標題: | A comprehensive study on the oxidation of 4H-SiC in diluted N2O ambient |
作者: | Tseng, Yuan-Hung Wu, Tsung-Han Tsui, Bing-Yue Yen, Cheng-Tyng Hung, Chien-Chung Lee, Chwan-Ying 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-Apr-2017 |
摘要: | The oxidation mechanism of 4H-SiC in diluted N2O ambient was studied at various temperatures, N2O flow rates, and N-2/N2O flow ratios. The collision partner, N-2 in this study, plays crucial roles in determining the oxidation rate and N-incorporation. According to the proposed oxidation mechanism, lowering the interface state density at lower oxidation temperatures is possible with a high-efficiency collision partner. (C) 2017 The Japan Society of Applied Physics |
URI: | http://dx.doi.org/10.7567/JJAP.56.04CR02 http://hdl.handle.net/11536/147859 |
ISSN: | 0021-4922 |
DOI: | 10.7567/JJAP.56.04CR02 |
期刊: | JAPANESE JOURNAL OF APPLIED PHYSICS |
Volume: | 56 |
Appears in Collections: | Articles |