標題: An innovative fuzzy and artificial neural network approach for forecasting yield under an uncertain learning environment
作者: Chen, Toly
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: Yield;Learning;Semiconductor;Fuzzy;Artificial neural network
公開日期: 1-Aug-2018
摘要: Most methods for fitting an uncertain yield learning process involve using fuzzy logic and solving mathematical programming (MP) problems, and thus have several drawbacks. The present study proposed a novel fuzzy and artificial neural network (ANN) approach for overcoming these drawbacks. In the proposed methodology, an ANN is used instead of an MP model to facilitate generating feasible solutions. A two-stage procedure is established to train the ANN. The proposed methodology and several existing methods were applied to a real case in a semiconductor manufacturing factory, and the experimental results showed that the methodology outperformed the existing methods in the overall forecasting performance.
URI: http://dx.doi.org/10.1007/s12652-017-0504-6
http://hdl.handle.net/11536/147930
ISSN: 1868-5137
DOI: 10.1007/s12652-017-0504-6
期刊: JOURNAL OF AMBIENT INTELLIGENCE AND HUMANIZED COMPUTING
Volume: 9
起始頁: 1013
結束頁: 1025
Appears in Collections:Articles