Title: | An innovative fuzzy and artificial neural network approach for forecasting yield under an uncertain learning environment |
Authors: | Chen, Toly 工業工程與管理學系 Department of Industrial Engineering and Management |
Keywords: | Yield;Learning;Semiconductor;Fuzzy;Artificial neural network |
Issue Date: | 1-Aug-2018 |
Abstract: | Most methods for fitting an uncertain yield learning process involve using fuzzy logic and solving mathematical programming (MP) problems, and thus have several drawbacks. The present study proposed a novel fuzzy and artificial neural network (ANN) approach for overcoming these drawbacks. In the proposed methodology, an ANN is used instead of an MP model to facilitate generating feasible solutions. A two-stage procedure is established to train the ANN. The proposed methodology and several existing methods were applied to a real case in a semiconductor manufacturing factory, and the experimental results showed that the methodology outperformed the existing methods in the overall forecasting performance. |
URI: | http://dx.doi.org/10.1007/s12652-017-0504-6 http://hdl.handle.net/11536/147930 |
ISSN: | 1868-5137 |
DOI: | 10.1007/s12652-017-0504-6 |
Journal: | JOURNAL OF AMBIENT INTELLIGENCE AND HUMANIZED COMPUTING |
Volume: | 9 |
Begin Page: | 1013 |
End Page: | 1025 |
Appears in Collections: | Articles |