完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.contributor.author | Yen, Cheng-Cheng | en_US |
dc.date.accessioned | 2014-12-08T15:20:53Z | - |
dc.date.available | 2014-12-08T15:20:53Z | - |
dc.date.issued | 2012-02-01 | en_US |
dc.identifier.issn | 0278-0046 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TIE.2011.2157292 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/14877 | - |
dc.description.abstract | A new on-chip 4-bit transient-to-digital converter for system-level electrostatic discharge (ESD) protection design is proposed. The proposed converter is designed to detect ESD-induced transient disturbances and transfer different ESD voltages into digital codes under system-level ESD tests. The experimental results in a 0.13-mu m CMOS integrated circuit with 1.8-V devices have confirmed the detection function and digital output codes. The proposed on-chip transient-to-digital converter can be code-signed with firmware operations to effectively enhance immunity of display systems against system-level ESD stresses. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Converter | en_US |
dc.subject | electromagnetic compatibility | en_US |
dc.subject | electrostatic discharge (ESD) | en_US |
dc.subject | system-level ESD test | en_US |
dc.subject | transient detection circuit | en_US |
dc.title | New 4-Bit Transient-to-Digital Converter for System-Level ESD Protection in Display Panels | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TIE.2011.2157292 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | en_US |
dc.citation.volume | 59 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.spage | 1278 | en_US |
dc.citation.epage | 1287 | en_US |
dc.contributor.department | 電機學院 | zh_TW |
dc.contributor.department | College of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000296014800062 | - |
dc.citation.woscount | 2 | - |
顯示於類別: | 期刊論文 |