DEGRADATION PHENOMENA DUE TO IMPULSE-CURRENT IN ZINC-OXIDE VARISTORS

doi:10.1111/j.1151-2916.1995.tb08041.x

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	BAI, SN	en_US
dc.contributor.author	TSENG, TY	en_US
dc.date.accessioned	2019-04-02T05:59:27Z	-
dc.date.available	2019-04-02T05:59:27Z	-
dc.date.issued	1995-10-01	en_US
dc.identifier.issn	0002-7820	en_US
dc.identifier.uri	http://dx.doi.org/10.1111/j.1151-2916.1995.tb08041.x	en_US
dc.identifier.uri	http://hdl.handle.net/11536/149159	-
dc.description.abstract	The relationship between the electrical characteristics of the ZnO varistors and applied current impulse is investigated in this study, The degradation phenomena of the ZnO varistors due to current impulse are studied by I-V and ac measurements, The influence of various numbers of applied surge on the I-V behaviors, V-0.1mA and leakage current, is attributed to the asymmetrical deformation of the grain-boundary barriers, As the applied impulses increase, the changes observed in the properties of deep bulk trap and conduction mechanism are attributed to the alternation of defect structure and model of conduction.	en_US
dc.language.iso	en_US	en_US
dc.title	DEGRADATION PHENOMENA DUE TO IMPULSE-CURRENT IN ZINC-OXIDE VARISTORS	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1111/j.1151-2916.1995.tb08041.x	en_US
dc.identifier.journal	JOURNAL OF THE AMERICAN CERAMIC SOCIETY	en_US
dc.citation.volume	78	en_US
dc.citation.spage	2685	en_US
dc.citation.epage	2689	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1995TJ79100015	en_US
dc.citation.woscount	12	en_US
顯示於類別：	期刊論文