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dc.contributor.authorChiu, MHen_US
dc.contributor.authorChen, CDen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2019-04-02T05:58:32Z-
dc.date.available2019-04-02T05:58:32Z-
dc.date.issued1996-09-01en_US
dc.identifier.issn1084-7529en_US
dc.identifier.urihttp://dx.doi.org/10.1364/JOSAA.13.001924en_US
dc.identifier.urihttp://hdl.handle.net/11536/149287-
dc.description.abstractBased on the heterodyne interferometric technique and the discrimination technique of using two light beams with different wavelengths, a novel method for identifying the fast axis of a wave plate and evaluating its phase retardation is presented. Some of the merits of the method, such as, a simple optical setup, high stability, better resolution, and easier operation, are presented, and the validity of the method is demonstrated. (C) 1996 Optical Society of America.en_US
dc.language.isoen_USen_US
dc.titleMethod for determining the fast axis and phase retardation of a wave plateen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/JOSAA.13.001924en_US
dc.identifier.journalJOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISIONen_US
dc.citation.volume13en_US
dc.citation.spage1924en_US
dc.citation.epage1929en_US
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.identifier.wosnumberWOS:A1996VE11300016en_US
dc.citation.woscount52en_US
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