完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChang, PHen_US
dc.contributor.authorHuang, CTen_US
dc.contributor.authorShie, JSen_US
dc.date.accessioned2019-04-02T06:00:21Z-
dc.date.available2019-04-02T06:00:21Z-
dc.date.issued1997-03-01en_US
dc.identifier.issn0013-4651en_US
dc.identifier.urihttp://dx.doi.org/10.1149/1.1837547en_US
dc.identifier.urihttp://hdl.handle.net/11536/149480-
dc.description.abstractThe current status of liquid-phase deposition (LPD) of SiO2 by adding boric acid (H3BO3) to a hydrofluosilicic acid (H2SiF6) is reviewed and compared with some new results from the authors' laboratory. Large discrepancies exist in the literature concerning the effects of Various processing parameters on deposition rate. We have shown that much confusion arises from the misconception of using an SiO2 additive to ''saturate'' and usng water to ''dilute'' the growth solution. In this paper the role of H2O as a reagent and the detrimental effect of an SiO2 additive as seeds for depleting the nutrient in the growth solution if added after the H2O addition are emphasized. Despite the variations between different investigators, the following characteristics of the LPD process are in general agreement: (i) the deposition process is surface controlled, (ii) the deposition rate depends approximately linearly on temperature, (iii) the deposition rate is constant (independent of time) over a wide range of experimental conditions, and (iv) the deposition rate increases with increasing boric acid concentration.en_US
dc.language.isoen_USen_US
dc.titleOn liquid-phase deposition of silicon dioxide by boric acid additionen_US
dc.typeArticleen_US
dc.identifier.doi10.1149/1.1837547en_US
dc.identifier.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.citation.volume144en_US
dc.citation.spage1144en_US
dc.citation.epage1149en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.identifier.wosnumberWOS:A1997WR23700065en_US
dc.citation.woscount11en_US
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