標題: Precision side-polished fibers with a long interaction length
作者: Liaw, SK
Chiu, JY
Tseng, SM
光電工程研究所
Institute of EO Enginerring
關鍵字: side-polished;negligible loss;long interaction length
公開日期: 15-九月-1997
摘要: We succeeded in fabricating precision side-polished fibers embedded in silicon V-grooves and then polished six fibers using a home-made polisher. The control of the polishing depth of the side-polished fibers was as accurate as +/-0.25 mu m. Another merit of our polished samples was their negligible losses even though the effective interaction lengths were long. Experimental calibrations of our samples agreed with theoretical results.
URI: http://dx.doi.org/10.1143/JJAP.36.L1179
http://hdl.handle.net/11536/149664
ISSN: 0021-4922
DOI: 10.1143/JJAP.36.L1179
期刊: JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
Volume: 36
顯示於類別:期刊論文