標題: | Precision side-polished fibers with a long interaction length |
作者: | Liaw, SK Chiu, JY Tseng, SM 光電工程研究所 Institute of EO Enginerring |
關鍵字: | side-polished;negligible loss;long interaction length |
公開日期: | 15-九月-1997 |
摘要: | We succeeded in fabricating precision side-polished fibers embedded in silicon V-grooves and then polished six fibers using a home-made polisher. The control of the polishing depth of the side-polished fibers was as accurate as +/-0.25 mu m. Another merit of our polished samples was their negligible losses even though the effective interaction lengths were long. Experimental calibrations of our samples agreed with theoretical results. |
URI: | http://dx.doi.org/10.1143/JJAP.36.L1179 http://hdl.handle.net/11536/149664 |
ISSN: | 0021-4922 |
DOI: | 10.1143/JJAP.36.L1179 |
期刊: | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS |
Volume: | 36 |
顯示於類別: | 期刊論文 |