| 標題: | Effect of microstructure on the nanomechanical properties of Zn1-xCdxSe alloys |
| 作者: | Wen, Hua-Chiang Yang, Chu-Shou Chou, Wu-Ching 電子物理學系 Department of Electrophysics |
| 關鍵字: | Nanoindentation;ZnCdSe;XTEM;Hardness |
| 公開日期: | 15-一月-2010 |
| 摘要: | We present a study of the nanoindentation behavior of Zn1-xCdxSe epilayers grown using molecular beam epitaxy; the surface roughness, microstructure, and crystallinity were analyzed using atomic force microscopy, cross-sectional transmission electron microscopy, and X-ray diffraction; the hardness H and elastic modulus E were studied using nanoindentation techniques. We found that these highly crystalline materials possessed no stacking faults or twins in their microstructures. We observed a very marked increase in the value of H and a significant decrease in the value of E upon increasing the concentration of Cd, presumably because of an increase in the stiffness of the CdSe bond relative to that of the ZnSe bond. We observed a corresponding shrinkage of the contact-induced damage area for those films having a small grain size and a higher value of H. It appears that resistance against contact-induced damage requires a higher Cd concentration. (C) 2009 Elsevier B.V. All rights reserved. |
| URI: | http://dx.doi.org/10.1016/j.apsusc.2009.09.059 http://hdl.handle.net/11536/149879 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/j.apsusc.2009.09.059 |
| 期刊: | APPLIED SURFACE SCIENCE |
| Volume: | 256 |
| 起始頁: | 2128 |
| 結束頁: | 2131 |
| 顯示於類別: | 期刊論文 |

