Interface Discrete Trap Induced Variability for Negative Capacitance FinFETs

標題:	Interface Discrete Trap Induced Variability for Negative Capacitance FinFETs
作者:	Lee, Ho-Pei Tseng, Kuei-Yang Su, Pin 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	1-Jan-2018
URI:	http://hdl.handle.net/11536/150744
ISSN:	1930-8868
期刊:	2018 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATION (VLSI-TSA)
Appears in Collections:	Conferences Paper