標題: IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
作者: Li, Katherine Shu-Min
Chang, Yao-Wen
Su, Chauchin
Lee, Chung-Len
Chen, Jwu E.
電子工程學系及電子研究所
電控工程研究所
Department of Electronics Engineering and Institute of Electronics
Institute of Electrical and Control Engineering
公開日期: 1-Jan-2006
摘要: We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and crosstalk glitches. We analyze the diagnosability of an interconnect structure and propose a fast diagnosability checking algorithm and an efficient diagnosis ring generation algorithm which achieves the optimal diagnosability. Two optimization techniques improve the efficiency and effectiveness of interconnect diagnosis. In all experiments, our method achieves 100% fault coverage and the optimal diagnosis resolution.
URI: http://hdl.handle.net/11536/150802
ISSN: 2153-6961
期刊: ASP-DAC 2006: 11TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, PROCEEDINGS
起始頁: 366
結束頁: 371
Appears in Collections:Conferences Paper