完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chen, Li-Chin | en_US |
dc.contributor.author | Huang, Chien-Chia | en_US |
dc.contributor.author | Chang, Yao-Lin | en_US |
dc.contributor.author | Chen, Hung-Ming | en_US |
dc.date.accessioned | 2019-04-02T06:04:51Z | - |
dc.date.available | 2019-04-02T06:04:51Z | - |
dc.date.issued | 2018-01-01 | en_US |
dc.identifier.issn | 2474-2724 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/150809 | - |
dc.description.abstract | The mutability of a circuit is a critical challenge due to the complexity of design rules. Global routing produces a congestion map on a coarse grid and feeds the results to the placer to optimize the design for reducing detailed-route DRC violations. However, there is a growing gap between global routing and the actual violations in detailed routing. This miscorrelation may end up unroutable for back-end detailed routing. In this work, a methodology as well as the framework How based on machine learning technique is proposed to effectively predict detailed routing violations. After extracting appropriate features from placement, fast global routing and detailed routing violations, we use support vector machine techniques to train the prediction model, different from regression framework. We then also develop a prediction model for DRC violation density which can be integrated into placers. Experimental results show that the proposed approach can effectively forecast routability during placement stage. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A Learning-Based Methodology for Routability Prediction in Placement | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2018 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT) | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:000450113800049 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |