標題: CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS
作者: HUANG, CM
WANG, TH
CHEN, T
PENG, NC
CHANG, A
SHONE, FC
交大名義發表
National Chiao Tung University
公開日期: 1-一月-1995
URI: http://hdl.handle.net/11536/151140
期刊: 1995 IEEE INTERNATIONAL RELIABILITY PHYSICS PROCEEDINGS, 33RD ANNUAL
起始頁: 61
結束頁: 64
顯示於類別:會議論文