CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS

Title:	CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS
Authors:	HUANG, CM WANG, TH CHEN, T PENG, NC CHANG, A SHONE, FC 交大名義發表 National Chiao Tung University
Issue Date:	1-Jan-1995
URI:	http://hdl.handle.net/11536/151140
Journal:	1995 IEEE INTERNATIONAL RELIABILITY PHYSICS PROCEEDINGS, 33RD ANNUAL
Begin Page:	61
End Page:	64
Appears in Collections:	Conferences Paper

APA	HUANG, C., WANG, T., CHEN, T., PENG, N., CHANG, A., & SHONE, F. (1995). CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS. WOS:A1995BD05F00011.
Bibtex	@article{HUANG1995CHARACTERIZATION, title={CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS}, author={HUANG, CM and WANG, TH and CHEN, T and PENG, NC and CHANG, A and SHONE, FC}, journal={WOS:A1995BD05F00011}, year={1995}, url={https://ir.lib.nycu.edu.tw/handle/11536/151140}, }