標題: | CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMS |
作者: | HUANG, CM WANG, TH CHEN, T PENG, NC CHANG, A SHONE, FC 交大名義發表 National Chiao Tung University |
公開日期: | 1-一月-1995 |
URI: | http://hdl.handle.net/11536/151140 |
期刊: | 1995 IEEE INTERNATIONAL RELIABILITY PHYSICS PROCEEDINGS, 33RD ANNUAL |
起始頁: | 61 |
結束頁: | 64 |
顯示於類別: | 會議論文 |