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dc.contributor.authorEdward Yi CHANGen_US
dc.contributor.authorShih-Chien LIUen_US
dc.contributor.authorChung-Kai HUANGen_US
dc.contributor.authorChia-Hsun WUen_US
dc.contributor.authorPing-Cheng HANen_US
dc.contributor.authorYueh-Chin LINen_US
dc.contributor.authorTing-En HSIEHen_US
dc.date.accessioned2019-04-11T06:08:08Z-
dc.date.available2019-04-11T06:08:08Z-
dc.date.issued2018-06-21en_US
dc.identifier.govdocH01L029/778en_US
dc.identifier.govdocH01L029/51en_US
dc.identifier.govdocH01L021/28en_US
dc.identifier.govdocH01L029/40en_US
dc.identifier.govdocH01L029/423en_US
dc.identifier.govdocH01L029/66en_US
dc.identifier.urihttp://hdl.handle.net/11536/151430-
dc.description.abstractA semiconductor device includes a substrate, a channel layer, a barrier layer, a recess, a charge trapping layer, a ferroelectric material layer, a gate, a source and a drain. The channel layer is disposed on the substrate. The barrier layer is disposed on the channel layer. The barrier layer has a recess, and a portion of the barrier layer under the recess has a thickness. The source and the drain are disposed on the barrier layer. The charge trapping layer covers the bottom of the recess. The ferroelectric material is disposed on the charge trapping layer. The gate is disposed on the ferroelectric material.en_US
dc.language.isoen_USen_US
dc.titleSEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEen_US
dc.typePatentsen_US
dc.citation.patentcountryUSAen_US
dc.citation.patentnumber20180175185en_US
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