Full metadata record
DC FieldValueLanguage
dc.contributor.authorHuang, Jyun-Hongen_US
dc.contributor.authorHsu, Hao-Huaen_US
dc.contributor.authorLee, Yao-Jenen_US
dc.contributor.authorHou, Tuo-Hungen_US
dc.date.accessioned2019-06-03T01:09:17Z-
dc.date.available2019-06-03T01:09:17Z-
dc.date.issued2018-01-01en_US
dc.identifier.isbn978-1-5386-1016-9en_US
dc.identifier.issn2378-377Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/152018-
dc.description.abstractAmong extensively researched 2D-TMDs, MoTe2 is an emerging but understudied material because of the lack of reliable and reproducible synthesis methods. The difficulties of its synthesis originate from the weak Mo-Te bonding energy, which results in the low chemical reactivity of MoTe2. Additionally, compared with other TMDs, MoTe2 is relatively unstable. It easily oxidizes and decomposes at high temperatures, which complicate the synthesis using conventional CVD. We have previously developed a PVD method capable of depositing large-area, high-crystallinity, few-layer 2D MoTe2 without complex designs of gas-phase transport or Mo-Te chemical reaction. MoTe2 is directly sputtered and post-annealed in a 2D encapsulation structure to improve its crystallinity. MoTe2 can be synthesized in either homogeneous semiconducting 2H or metallic 1T' phase by controlling the adequate thermal budget during annealing. This talk will mainly discuss the process optimization and electrical properties of 1T'-MoTe2, which is potentially important in several emerging research fields, including 2D interconnect, topological superconductor, and 2H-1T' in-plane homojunction transistor.en_US
dc.language.isoen_USen_US
dc.titleHigh-conductance Two-dimensional 1T '-MoTe2 Synthesized by Sputteringen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2018 IEEE 13TH NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE (NMDC)en_US
dc.citation.spage84en_US
dc.citation.epage85en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000467808200021en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper