標題: Avalanche Ruggedness Capability and Improvement of 5-V n-Channel Large-Array MOSFET in BCD Process
作者: Nidhi, Karuna
Ker, Ming-Dou
Lee, Jian-Hsing
Huang, Shao-Chang
交大名義發表
電子工程學系及電子研究所
National Chiao Tung University
Department of Electronics Engineering and Institute of Electronics
關鍵字: Avalanche ruggedness;avalanche safe-operating-area (A-SOA);current in avalanche (IAV);large-array device (LAD);time in avalanche (tAV);total gate charge (Qg);unclamped inductive switching (UIS)
公開日期: 1-七月-2019
摘要: Energy handling capability of large-array devices (LADs) is one of the most dominating concerns for the designers that affect the device design and its reliability. In this paper, the improvement of the avalanche ruggedness capability by using an optional implantation layer has been investigated the first time for the application of 5-V n-channel large-array MOSFET in a bipolar-CMOS-DMOS (BCD) process. Experimental results with extensive measurements verified that the maximum avalanche current (I-AV) achieved from themodified device is enhanced by more than twice. Moreover, the energy in avalanche single pulse (EAS) capability is improved by more than five times. A significant improvement is noticed in the avalanche safe-operating-area (A-SOA) as compared to the original device, and the failure analysis is discussed in detail. In addition, the impact of an optional implantation layer on the total gate charge (Qg) is also compared for a LAD with a total width of 12 000 mu m.
URI: http://dx.doi.org/10.1109/TED.2019.2916032
http://hdl.handle.net/11536/152183
ISSN: 0018-9383
DOI: 10.1109/TED.2019.2916032
期刊: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 66
Issue: 7
起始頁: 3040
結束頁: 3048
顯示於類別:期刊論文