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dc.contributor.authorKo, Cheng-Taen_US
dc.contributor.authorChen, Kuan-Nengen_US
dc.date.accessioned2014-12-08T15:21:23Z-
dc.date.available2014-12-08T15:21:23Z-
dc.date.issued2012-02-01en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.microrel.2011.03.038en_US
dc.identifier.urihttp://hdl.handle.net/11536/15218-
dc.description.abstract3D integration provides a promising solution to achieve system level integration with high function density, small form factor, enhanced transmission speed and low power consumption. Stacked bonding is the key technology to enable the communication between different strata of the 3D integration system. Low temperature bonding approaches are explored in industry to solve the performance degradation issue of the integrated devices. In this paper, various low temperature bonding technologies are reviewed and introduced, as well as the latest developments in world-wide companies and research institutes. The outlook for industrial application is also addressed in the paper. (C) 2011 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleLow temperature bonding technology for 3D integrationen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.microrel.2011.03.038en_US
dc.identifier.journalMICROELECTRONICS RELIABILITYen_US
dc.citation.volume52en_US
dc.citation.issue2en_US
dc.citation.spage302en_US
dc.citation.epage311en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000300190600002-
dc.citation.woscount15-
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