標題: Local Cyber-Physical Attack for Masking Line Outage and Topology Attack in Smart Grid
作者: Chung, Hwei-Ming
Li, Wen-Tai
Yuen, Chau
Chung, Wei-Ho
Zhang, Yan
Wen, Chao-Kai
交大名義發表
National Chiao Tung University
關鍵字: Cyber-physical system;joint attacks;smart grid;power line outages;power flow
公開日期: 1-Jul-2019
摘要: Malicious attacks in the power system can eventually result in a large-scale cascade failure if not rectified in a timely manner. These attacks, which are traditionally classified into physical and cyber attacks, can be avoided by using the latest advanced detection mechanisms. However, a new threat called cyber-physical attacks jointly targets both the physical and cyber layers of the system to interfere with the operations of the power grid is more malicious than traditional attacks. In this paper, we propose a new cyber-physical attack strategy where the transmission line is first physically disconnected, the line-outage event is masked to mislead the control center into detecting this as an obvious line outage at a different position in the local area of the power system. Therefore, the topology information in the control center is interfered with as a result of our attack. We also propose a novel procedure for selecting vulnerable lines and analyze the observability of our proposed framework. Our proposed method can effectively and continuously deceive the control center into detecting fake line-outage positions, and thereby increase the chance of cascade failure because the attention is given to the fake outage. The simulation results validate the efficiency of our proposed attack strategy.
URI: http://dx.doi.org/10.1109/TSG.2018.2865316
http://hdl.handle.net/11536/152197
ISSN: 1949-3053
DOI: 10.1109/TSG.2018.2865316
期刊: IEEE TRANSACTIONS ON SMART GRID
Volume: 10
Issue: 4
起始頁: 4577
結束頁: 4588
Appears in Collections:Articles