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dc.contributor.authorWu, W. T.en_US
dc.contributor.authorHsieh, H. C.en_US
dc.contributor.authorChen, Y. L.en_US
dc.contributor.authorChang, W. Y.en_US
dc.contributor.authorSu, D. C.en_US
dc.date.accessioned2014-12-08T15:21:24Z-
dc.date.available2014-12-08T15:21:24Z-
dc.date.issued2010en_US
dc.identifier.isbn978-0-8194-8263-1en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/15224-
dc.identifier.urihttp://dx.doi.org/10.1117/12.860356en_US
dc.description.abstractA simple method for measuring a step-height sample is presented with the heterodyne central fringe identification technique and a precision translation stage. This method can accurately point out the zero optical path difference position such that the optical path lengths of two arms of the interferometer are absolutely equivalent. Thus, the two surfaces of the step-height sample can be identified sequentially with the translation stage. The displacement of the translation stage is equal to the step-height of the test sample. The feasibility of the technique is demonstrated. The measurable range is not limited by the coherence length of the light source. The measurement accuracy depends on the uncertainties of the heterodyne central fringe identification method and the translation stage. In our setup, we have a 100 mm measurable range and a 4 nm uncertainty. The wavelength stability of the light source has a minor effect on the measurement.en_US
dc.language.isoen_USen_US
dc.subjectcentral fringeen_US
dc.subjectheterodyne interferometryen_US
dc.subjectelectro-optic modulatoren_US
dc.subjecttunable laseren_US
dc.subjecttranslation stageen_US
dc.subjectstep-heighten_US
dc.titleStep Height Measurement by Using Heterodyne Central Fringe Identification Techniqueen_US
dc.typeArticleen_US
dc.identifier.doi10.1117/12.860356en_US
dc.identifier.journalINSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING IVen_US
dc.citation.volume7767en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000285828500008-
Appears in Collections:Conferences Paper


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