Finite Element Models of Neuron Electrode Sealing Interfaces

Abstract

It is desirable to detect any leakage current when microelectrode is used to stimulate a neuron electrically. This paper proposes a new approach to study the neuron-electrode sealing interface problem. As opposite to the traditional bi-domain FEM that need a two-step process of indirect coupling of two domains with a circuit equation, which involves solving a set of ordinary differential equation, this paper proposed a more elegant approach to study the neuron-electrode sealing interface problem based on a single domain finite element model. The result shows the stimulation electrical potential distribution and the sealing resistance match the published simulation and experimental results.