標題: Finite Element Models of Neuron Electrode Sealing Interfaces
作者: Choi, Charles T. M.
You, Shan-Jen
分子醫學與生物工程研究所
資訊工程學系
電機工程學系
Institute of Molecular Medicine and Bioengineering
Department of Computer Science
Department of Electrical and Computer Engineering
關鍵字: Bio-electric problem;finite element model;neuron-electrode interface;sealing resistance
公開日期: 1-Feb-2012
摘要: It is desirable to detect any leakage current when microelectrode is used to stimulate a neuron electrically. This paper proposes a new approach to study the neuron-electrode sealing interface problem. As opposite to the traditional bi-domain FEM that need a two-step process of indirect coupling of two domains with a circuit equation, which involves solving a set of ordinary differential equation, this paper proposed a more elegant approach to study the neuron-electrode sealing interface problem based on a single domain finite element model. The result shows the stimulation electrical potential distribution and the sealing resistance match the published simulation and experimental results.
URI: http://dx.doi.org/10.1109/TMAG.2011.2175717
http://hdl.handle.net/11536/15232
ISSN: 0018-9464
DOI: 10.1109/TMAG.2011.2175717
期刊: IEEE TRANSACTIONS ON MAGNETICS
Volume: 48
Issue: 2
起始頁: 643
結束頁: 646
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