標題: | A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production |
作者: | Tu, K. N. Gusak, A. M. 國際半導體學院 International College of Semiconductor Technology |
公開日期: | 21-Aug-2019 |
摘要: | We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given. Published under license by AIP Publishing. |
URI: | http://dx.doi.org/10.1063/1.5111159 http://hdl.handle.net/11536/152855 |
ISSN: | 0021-8979 |
DOI: | 10.1063/1.5111159 |
期刊: | JOURNAL OF APPLIED PHYSICS |
Volume: | 126 |
Issue: | 7 |
起始頁: | 0 |
結束頁: | 0 |
Appears in Collections: | Articles |