標題: A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production
作者: Tu, K. N.
Gusak, A. M.
國際半導體學院
International College of Semiconductor Technology
公開日期: 21-Aug-2019
摘要: We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given. Published under license by AIP Publishing.
URI: http://dx.doi.org/10.1063/1.5111159
http://hdl.handle.net/11536/152855
ISSN: 0021-8979
DOI: 10.1063/1.5111159
期刊: JOURNAL OF APPLIED PHYSICS
Volume: 126
Issue: 7
起始頁: 0
結束頁: 0
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