Title: Characteristic Simulation of Hybrid Multilayer Junctionless Field Effect Transistors with Negative Capacitance Effect
Authors: Ma, Jun
Liu, Chien
Liu, Wei-Dong
Hung, Yu-Wen
Fan, Yu-Chi
Hsu, Hsiao-Hsuan
Zheng, Zhi-Wei
Cheng, Chun-Hu
電子物理學系
Department of Electrophysics
Keywords: Gate-all-around;junctionless;negative effect
Issue Date: 1-Jan-2020
Abstract: In this study, we reported a hybrid multi-PNPN channel junctionless field effect transistor (JLFET) with negative capacitance (NC) effect by simulation. By incorporating a ferroelectric HfAlO capacitor with NC effect, an extremely low subthreshold swing of 34 mVdecade, a very high onoff current ratio and a very low driven voltage were achieved in the NC-enhanced hybrid multi-PNPN channel JLFET. This novel device not only improves the on-state current reduction while channel scaling down, but also shows great potential for the next-generation low-power three-dimensional stacked integrated circuit applications.
URI: http://dx.doi.org/10.1109/TNANO.2019.2961631
http://hdl.handle.net/11536/153557
ISSN: 1536-125X
DOI: 10.1109/TNANO.2019.2961631
Journal: IEEE TRANSACTIONS ON NANOTECHNOLOGY
Volume: 19
Begin Page: 89
End Page: 93
Appears in Collections:Articles