完整後設資料紀錄
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dc.contributor.authorLiu, Chienen_US
dc.contributor.authorChen, Hsuan-Hanen_US
dc.contributor.authorTung, Yi-Chunen_US
dc.contributor.authorWang, Wei-Chunen_US
dc.contributor.authorHuang, Zhong-Yingen_US
dc.contributor.authorShih, Bing-Yangen_US
dc.contributor.authorHsiung, Szu-Yenen_US
dc.contributor.authorWang, Shih-Anen_US
dc.contributor.authorFan, Yu-Chien_US
dc.contributor.authorLee, Tsung-Mingen_US
dc.contributor.authorLin, Chien-Liangen_US
dc.contributor.authorHuang, Zi-Youen_US
dc.contributor.authorLiu, Hsiu-Mingen_US
dc.contributor.authorLee, Shengen_US
dc.contributor.authorChou, Wu-Chingen_US
dc.contributor.authorCheng, Chun-Huen_US
dc.contributor.authorHsu, Hsiao-Hsuanen_US
dc.date.accessioned2020-05-05T00:02:22Z-
dc.date.available2020-05-05T00:02:22Z-
dc.date.issued2020-04-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.7567/1347-4065/ab6420en_US
dc.identifier.urihttp://hdl.handle.net/11536/154172-
dc.description.abstractIn this work, we demonstrated that the 5-nm-thick HfAlOx negative capacitance transistor (NCFET) with optimized Al doping can achieve a minimum 33 mV dec(-1) subthreshold swing (SS), an ultralow l(off) of 7.44 fA mu m(-1), and a high l(on)//l(off) ratio of 1.9 x 10(8). The NC switching with sub-60 mV dec(-1) SS can be implemented from V-DS - 0.2 V to 0.8 V due to an ultralow off-state leakage current. The experimental results reveal that well-controlled Al doping in HfAlOx not only reduces off-state leakage of the transistor, but also improves the ferroelectric NC effect to achieve a sub-60 mV dec-1 switching under a favorably low sub-1 voltage. This scaled HfAlOx NCFET with optimized Al doping and fluorine defect passivation shows the great potential for the application of low power logic devices. (C) 2020 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleHigh performance negative capacitance field-effect transistor featuring low off-state current, high on/off current ratio, and steep sub-60 mV dec(-1) swingen_US
dc.typeArticleen_US
dc.identifier.doi10.7567/1347-4065/ab6420en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume59en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000519630000006en_US
dc.citation.woscount0en_US
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