Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope

標題:	Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope
作者:	Zhuo, Guan-Yu Yang, Zu-Po Chan, Ming-Che 光電系統研究所 Institute of Photonic System
公開日期:	1-Jan-2018
摘要:	For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.
URI:	http://hdl.handle.net/11536/154263
ISBN:	978-1-9435-8042-2
ISSN:	2160-9020
期刊:	2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)
起始頁:	0
結束頁:	0
Appears in Collections:	Conferences Paper