標題: Design Strategies for Mesa-Type GaN-Based Schottky Barrier Diodes for Obtaining High Breakdown Voltage and Low Leakage Current
作者: Jia, Xingyu
Chen, Sung-Wen Huang
Liu, Yajin
Hou, Xu
Zhang, Yonghui
Zhang, Zi-Hui
Kuo, Hao-Chung
光電工程學系
Department of Photonics
關鍵字: Breakdown voltage;device optimization;leakage current;trench MIS barrier-controlled Schot-tky (TMBS) rectifiers
公開日期: 1-五月-2020
摘要: In this article, we have systematically investigated the impact of different structural parameters on the breakdown voltage for GaN-based trench MIS barrier-controlled Schottky (TMBS) rectifier. Compared with the planar Schottky rectifier, the TMBS rectifier has field plates on the mesa sidewalls so that the drift region can be depleted in a 2-D manner, which helps to decrease the electric field at the metal/mesa interface. However, the adoption of mesas can make the electric potential lines at the mesa corner dense and has large curvatures. Therefore, the premature breakdown can occur when the electric field therein reaches the critical condition. We find that the electric field profiles can be affected by insulation layer thickness, mesa width, trench depth, and different types of insulation layers. Then, we increase the breakdown voltage by homogenizing the electric field distribution in the mesa region, e.g., the electric field at mesa corners can be decreased by adopting properly thick sidewall insulator and small trench depth. Meanwhile, TMBS rectifier using sidewall insulating material with a large dielectric constant more favors a large breakdown voltage.
URI: http://dx.doi.org/10.1109/TED.2020.2978007
http://hdl.handle.net/11536/154507
ISSN: 0018-9383
DOI: 10.1109/TED.2020.2978007
期刊: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 67
Issue: 5
起始頁: 1931
結束頁: 1938
顯示於類別:期刊論文