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dc.contributor.authorYang, Yi-Lunen_US
dc.contributor.authorIto, Hiroyukien_US
dc.contributor.authorKim, Young Suken_US
dc.contributor.authorOhba, Takayukien_US
dc.contributor.authorChen, Kuan-Nengen_US
dc.date.accessioned2020-10-05T01:59:48Z-
dc.date.available2020-10-05T01:59:48Z-
dc.date.issued2020-06-01en_US
dc.identifier.issn2156-3950en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCPMT.2020.2968561en_US
dc.identifier.urihttp://hdl.handle.net/11536/154923-
dc.description.abstractThe adhesion between metal and polymer layer was studied using four-point bending tests. It was shown that as the annealing temperature increased, oxidation binding increased, which decreased adhesion and reduced the value. A new four-point bending test sample prepared using the stealth dicing method with a 100 & x0025; success rate was proposed for the first time. With samples prepared with stealth dicing, the region where crack extension occurred was smaller after the stress test. Less crack extension generated less loading on the samples. Owing to the coefficient of thermal expansion (CTE) mismatch after increasing the temperature in a highly accelerated stress test (HAST), a void formed in stealth dicing was made close to the interface between the silicon layer and the polymer layer after the stress test, and less crack extension occurred compared with samples kept at room temperature. The smaller loading force guarantees much more stable measurement with a higher success rate after the stress tests. The stealth dicing method can be applied to other structures, such as redistribution layers (RDLs).en_US
dc.language.isoen_USen_US
dc.subjectPolymersen_US
dc.subjectAdhesivesen_US
dc.subjectDiamonden_US
dc.subjectSiliconen_US
dc.subjectCuringen_US
dc.subjectAnnealingen_US
dc.subject3-D integrated circuit (3-D IC)en_US
dc.subjectfour-point bendingen_US
dc.subjectpolymer adhesionen_US
dc.titleEvaluation of Metal/Polymer Adhesion and Highly Reliable Four-Point Bending Test Using Stealth Dicing Method in 3-D Integrationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCPMT.2020.2968561en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGYen_US
dc.citation.volume10en_US
dc.citation.issue6en_US
dc.citation.spage956en_US
dc.citation.epage962en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000541132400004en_US
dc.citation.woscount0en_US
Appears in Collections:Articles