標題: | Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency |
作者: | Solis Canto, O. Murillo-Bracamontes, E. A. Gervacio-Arciniega, J. J. Toledo-Solano, M. Torres-Miranda, G. Cruz-Valeriano, E. Chu, Y. H. Palomino-Ovando, M. A. Enriquez-Flores, C. I. Mendoza, M. E. Hmok, H'Linh Cruz, M. P. 材料科學與工程學系 Department of Materials Science and Engineering |
公開日期: | 28-八月-2020 |
摘要: | Single-frequency piezoresponse force microscopy (PFM) images of a BiFeO3/DyScO3(110) thin film, obtained with long (k(c)=0.82N/m) and short (k(c)=7.64N/m) cantilevers, were analyzed as a function of the applied voltage frequency. For long cantilevers, the electrostatic and electrostrictive contributions were identified. These contributions were reduced with a frequency near the second mode of the contact resonance; while for short cantilevers, the first mode was necessary. A method for domain structure analyses, to discriminate a ferroelectric behavior from a non-ferroelectric, through the optimization of PFM images, is also described. The analysis can be extended to cantilevers with different spring constants and ferroelectric materials. |
URI: | http://dx.doi.org/10.1063/5.0013287 http://hdl.handle.net/11536/155317 |
ISSN: | 0021-8979 |
DOI: | 10.1063/5.0013287 |
期刊: | JOURNAL OF APPLIED PHYSICS |
Volume: | 128 |
Issue: | 8 |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 期刊論文 |