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dc.contributor.authorHuang, Jiun-Jiaen_US
dc.contributor.authorHou, Tuo-Hungen_US
dc.contributor.authorHsu, Chung-Weien_US
dc.contributor.authorTseng, Yi-Mingen_US
dc.contributor.authorChang, Wen-Hsiungen_US
dc.contributor.authorJang, Wen-Yuehen_US
dc.contributor.authorLin, Chen-Hsien_US
dc.date.accessioned2014-12-08T15:23:20Z-
dc.date.available2014-12-08T15:23:20Z-
dc.date.issued2012-04-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/04DD09en_US
dc.identifier.urihttp://hdl.handle.net/11536/16355-
dc.description.abstractWe report the first demonstration of a flexible one diode-one resistor (1D1R) resistive-switching (RS) memory cell capable of high-density crossbar array implementation at an extremely low cost. A Ti/TiO2/Pt diode with a large rectifying ratio and a stable Ni/HfO2/Pt unipolar RS memory element have been fabricated on a polyimide substrate using only room-temperature processes. No significant degradation of the rectifying ratio of the TiO2 diode and the cycling variations, retention, and read disturb immunity of the HfO2 memory was observed in the bending state. The series 1D1R cell shows highly reproducible unipolar RS because of the low reset current of the HfO2 memory, which greatly mitigates the adverse effect of diode series resistance. Furthermore, the 1D1R cell can effectively suppress read interference and realize a crossbar array as large as 512 kbit. (C) 2012 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleFlexible One Diode-One Resistor Crossbar Resistive-Switching Memoryen_US
dc.typeArticleen_US
dc.identifier.doi04DD09en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume51en_US
dc.citation.issue4en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000303928600032-
dc.citation.woscount11-
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