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dc.contributor.authorHsu, Shan-Chunen_US
dc.contributor.authorHsin, Cheng-Lunen_US
dc.contributor.authorHuang, Chun-Weien_US
dc.contributor.authorYu, Shih-Yingen_US
dc.contributor.authorWang, Chun-Wenen_US
dc.contributor.authorLu, Chi-Mingen_US
dc.contributor.authorLu, Kuo-Changen_US
dc.contributor.authorWu, Wen-Weien_US
dc.date.accessioned2014-12-08T15:23:45Z-
dc.date.available2014-12-08T15:23:45Z-
dc.date.issued2012en_US
dc.identifier.issn1466-8033en_US
dc.identifier.urihttp://hdl.handle.net/11536/16567-
dc.description.abstractSingle-crystalline germanium nanowires were synthesized via vapor-liquid-solid mechanism. The characteristics of the Ge nanowires were investigated by a transmission electron microscope to identify the [111] growth direction. The Ge nanowire-based field-effect-transistors on Si3N4 dielectrics were fabricated, showing a p-type semiconducting behavior with hole mobility of 47.03 cm(2) V-1 s(-1). The formation of Cu3Ge/Ge/Cu3Ge nanoheterostructures was demonstrated with the reaction between copper contacts and Ge nanowires by rapid thermal annealing. The diameter-dependent electrical transport property of Ge nanowires indicates that with diameters of more than 80 nm, the resistivity of Ge nanowires decreased with diameter decrease, while with diameters of less than 80 nm, it increased. With multiple annealing processes, the channel length of the Ge nanowire transistors can be successfully controlled. From electrical measurements of each annealing step, the electrical transport property was significantly improved by sequential formation of Cu3Ge contacts. The gradual formation of the germanide structure reduces Fermi level pinning effect and increases the Ohmic behavior of electrical transportation.en_US
dc.language.isoen_USen_US
dc.titleSingle-crystalline Ge nanowires and Cu3Ge/Ge nano-heterostructuresen_US
dc.typeArticleen_US
dc.identifier.journalCRYSTENGCOMMen_US
dc.citation.volume14en_US
dc.citation.issue14en_US
dc.citation.epage4570en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000305530500005-
dc.citation.woscount2-
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