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dc.contributor.authorChen, Wei-Chenen_US
dc.contributor.authorLin, Chuan-Dingen_US
dc.contributor.authorLin, Horng-Chihen_US
dc.contributor.authorHuang, Tiao-Yuanen_US
dc.date.accessioned2014-12-08T15:24:26Z-
dc.date.available2014-12-08T15:24:26Z-
dc.date.issued2009en_US
dc.identifier.isbn978-1-4244-2784-0en_US
dc.identifier.urihttp://hdl.handle.net/11536/16954-
dc.description.abstractA simple method for fabricating poly-Si nanowire (NW) TFT with multiple gates is proposed and characterized. In this structure, NW is formed mainly using both anisotropic and highly selective isotropic plasma etching. It is found that when the size of NW is scaled down, double-gated operation provides more improvement. Furthermore, by utilizing this unique independent double-gated Configuration, the function of threshold voltage modulation is investigated.en_US
dc.language.isoen_USen_US
dc.titleA Novel Double-gated Nanowire TFT and Investigation of Its Size Dependencyen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF TECHNICAL PROGRAM: 2009 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONSen_US
dc.citation.spage121en_US
dc.citation.epage122en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000272451000054-
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