完整後設資料紀錄
DC 欄位語言
dc.contributor.authorAroonsantidecha, Suradethen_US
dc.contributor.authorLiu, Sean Shih-Yingen_US
dc.contributor.authorChin, Ching-Yuen_US
dc.contributor.authorChen, Hung-Mingen_US
dc.date.accessioned2014-12-08T15:24:33Z-
dc.date.available2014-12-08T15:24:33Z-
dc.date.issued2012en_US
dc.identifier.isbn978-1-4673-0772-7en_US
dc.identifier.issn2153-6961en_US
dc.identifier.urihttp://hdl.handle.net/11536/17014-
dc.description.abstractIn this paper, we propose a fast and accurate thermal aware analytical placer. Thermal model is constructed based on Green function with enhanced DCT to generate full chip temperature profile. Unlike other previous thermal aware placers, our thermal model is tightly integrated with a flat force directed placement. A thermal spreading force based on 2D Gaussian model is proposed to reduce maximum on-chip temperature with dynamic hot region size control, optimizing between total half-perimeter wirelength (HPWL) and on-chip temperature distribution. Our thermal model is evaluated by the most recent commercial tool and has an average deviation of 6.5% with 242x speed up. Our placer can reach the same quality compared to Capo and APlace2 with 2-3x speed up. Experiments are tested using ISPD 2005 benchmark with up to 2 million gate design. The results are further evaluated using GSRC Bookshelf Evaluator for total HPWL, and using ICEPAK for temperature distribution. To the best of our knowledge, this is the first thermal-aware placer using analytical thermal model and experimented on large scale design. It takes 6.5 hours to complete entire 2005 ISPD benchmark using our thermal aware placer.en_US
dc.language.isoen_USen_US
dc.titleA Fast Thermal Aware Placement with Accurate Thermal Analysis Based on Green Functionen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2012 17TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC)en_US
dc.citation.spage425en_US
dc.citation.epage430en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000309240000070-
顯示於類別:會議論文