完整後設資料紀錄
DC 欄位語言
dc.contributor.authorKao, H. L.en_US
dc.contributor.authorChin, Alberten_US
dc.contributor.authorLiao, C. C.en_US
dc.contributor.authorTseng, Y. Y.en_US
dc.contributor.authorMcAlister, S. P.en_US
dc.contributor.authorChi, C. C.en_US
dc.date.accessioned2014-12-08T15:24:55Z-
dc.date.available2014-12-08T15:24:55Z-
dc.date.issued2006en_US
dc.identifier.isbn978-0-7803-9541-1en_US
dc.identifier.issn0149-645Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/17299-
dc.identifier.urihttp://dx.doi.org/10.1109/MWSYM.2006.249856en_US
dc.description.abstractBy applying 0.7% tensile strain to the flexible die of a 0.13 mu m thin-body (40 mu m) Si MOSFET mounted on plastic, both the DC and RF performance have been improved. The current I(d,sat) was 14.3% higher, and f(T) increased from 103 to 118 GHz with NF(min) decreasing from 0.89 to 0.75 dB at 10 GHz. These improvements are comparable with those for SiN-capped 90 nm strained-Si nMOS and consistent with device simulations. The approach has the advantages of better RF passive devices on the insulating plastic substrate and low cost.en_US
dc.language.isoen_USen_US
dc.subjectRF noiseen_US
dc.subjectassociated gainen_US
dc.subjectMOSFETen_US
dc.subjectplasticen_US
dc.titleDC-RF performance improvement for strained 0.13 mu m MOSFETs mounted on a flexible plastic substrateen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/MWSYM.2006.249856en_US
dc.identifier.journal2006 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-5en_US
dc.citation.spage2043en_US
dc.citation.epage2046en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000244379004094-
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