完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Kao, H. L. | en_US |
dc.contributor.author | Chin, Albert | en_US |
dc.contributor.author | Liao, C. C. | en_US |
dc.contributor.author | Tseng, Y. Y. | en_US |
dc.contributor.author | McAlister, S. P. | en_US |
dc.contributor.author | Chi, C. C. | en_US |
dc.date.accessioned | 2014-12-08T15:24:55Z | - |
dc.date.available | 2014-12-08T15:24:55Z | - |
dc.date.issued | 2006 | en_US |
dc.identifier.isbn | 978-0-7803-9541-1 | en_US |
dc.identifier.issn | 0149-645X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/17299 | - |
dc.identifier.uri | http://dx.doi.org/10.1109/MWSYM.2006.249856 | en_US |
dc.description.abstract | By applying 0.7% tensile strain to the flexible die of a 0.13 mu m thin-body (40 mu m) Si MOSFET mounted on plastic, both the DC and RF performance have been improved. The current I(d,sat) was 14.3% higher, and f(T) increased from 103 to 118 GHz with NF(min) decreasing from 0.89 to 0.75 dB at 10 GHz. These improvements are comparable with those for SiN-capped 90 nm strained-Si nMOS and consistent with device simulations. The approach has the advantages of better RF passive devices on the insulating plastic substrate and low cost. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | RF noise | en_US |
dc.subject | associated gain | en_US |
dc.subject | MOSFET | en_US |
dc.subject | plastic | en_US |
dc.title | DC-RF performance improvement for strained 0.13 mu m MOSFETs mounted on a flexible plastic substrate | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1109/MWSYM.2006.249856 | en_US |
dc.identifier.journal | 2006 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-5 | en_US |
dc.citation.spage | 2043 | en_US |
dc.citation.epage | 2046 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000244379004094 | - |
顯示於類別: | 會議論文 |