Contaminations of MgO Thin Films by Phosphors for the Surface and Vertical Discharge Type AC-PDP

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DC 欄位	值	語言
dc.contributor.author	Jen, Ko-Ruey	en_US
dc.contributor.author	Kim, Sung-O	en_US
dc.contributor.author	Chen, Kuang-Lang	en_US
dc.contributor.author	Chen, Samuel	en_US
dc.contributor.author	Lee, Chien-Pang	en_US
dc.contributor.author	Huang, Chih-Ming	en_US
dc.contributor.author	Hsu, Chien-Hsing	en_US
dc.date.accessioned	2014-12-08T15:24:59Z	-
dc.date.available	2014-12-08T15:24:59Z	-
dc.date.issued	2006	en_US
dc.identifier.issn	1738-7558	en_US
dc.identifier.uri	http://hdl.handle.net/11536/17365	-
dc.description.abstract	The panels were fabricated to characterize the contamination of Magnesium Oxide (MgO) thin films by phosphors and ion bombardments in AC-PDPs. Forty-six inch WVGA panels of the surface and vertical discharge type were manufactured. The experiment was designed to investigate the relationship between the MgO thin films and phosphor contamination caused by ion bombardments in a plasma environment to produce a time lest. The contamination of MgO thin films by phosphors was investigated by way of X-ray photoelectron spectroscopy (XPS).	en_US
dc.language.iso	en_US	en_US
dc.title	Contaminations of MgO Thin Films by Phosphors for the Surface and Vertical Discharge Type AC-PDP	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	IMID/IDMC 2006: THE 6TH INTERNATIONAL MEETING ON INFORMATION DISPLAY/THE 5TH INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE, DIGEST OF TECHNICAL PAPERS	en_US
dc.citation.spage	18	en_US
dc.citation.epage	20	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000259669300003	-
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