DC and AC NBTI stresses in pMOSFETs with PE-SiN capping

標題:	DC and AC NBTI stresses in pMOSFETs with PE-SiN capping
作者:	Lu, Chia-Yu Lin, Horng-Chih Chang, Yi-Feng Huang, Tiao-Yuan 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	2006
URI:	http://hdl.handle.net/11536/17482 http://dx.doi.org/10.1109/RELPHY.2006.251345
ISBN:	0-7803-9498-4
DOI:	10.1109/RELPHY.2006.251345
期刊:	2006 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 44TH ANNUAL
起始頁:	727
結束頁:	728
Appears in Collections:	Conferences Paper

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