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dc.contributor.authorShih, CHen_US
dc.contributor.authorHuang, JDen_US
dc.contributor.authorJou, JYen_US
dc.date.accessioned2014-12-08T15:25:10Z-
dc.date.available2014-12-08T15:25:10Z-
dc.date.issued2005en_US
dc.identifier.isbn0-7803-9571-9en_US
dc.identifier.issn1552-6674en_US
dc.identifier.urihttp://hdl.handle.net/11536/17556-
dc.description.abstractVerifying if air integrated component is compliant with certain interface protocol is a big issue in component-based SOC designs. Massive constrained random simulation stimuli are becoming crucial to achieve a high verification quality. To further improve the quality, the stimulus biasing technique should be used to guide the simulation to hit design corners. In this paper we model the interface protocol with the non-deterministic extended finite state machine (NEFSM), and then propose an automatic stimulus generation approach based oil the NEFSM. This approach is capable of providing numerous biasing options. Experiment results demonstrate the high controllability scheme.en_US
dc.language.isoen_USen_US
dc.titleStimulus generation for interface protocol verification using the non-deterministic extended finite state machine modelen_US
dc.typeProceedings Paperen_US
dc.identifier.journalHLDVT'05: TENTH ANNUAL IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGSen_US
dc.citation.spage87en_US
dc.citation.epage93en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000235258100011-
Appears in Collections:Conferences Paper