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dc.contributor.authorJian, ZCen_US
dc.contributor.authorLin, JYen_US
dc.contributor.authorHsieh, PJen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2014-12-08T15:25:14Z-
dc.date.available2014-12-08T15:25:14Z-
dc.date.issued2005en_US
dc.identifier.isbn0-8194-5856-2en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/17610-
dc.identifier.urihttp://dx.doi.org/10.1117/12.612480en_US
dc.description.abstractWhen a light coming from a circularly polarized heterodyne light source incidents on an optical material, a phase difference between s- and p- polarization components of the reflected light occurs. This phase difference can be measured accurately with the heterodyne interterometry. The measured data are substituted into the special equations derived from Fresnel equations, the refractive index can be estimated. This method bears both merits of a common-path interferometer and a heterodyne interferometer. The refractive indices of three optical glasses and two birefringent crystals were measured to show the validity of this method.en_US
dc.language.isoen_USen_US
dc.subjectrefractive indexen_US
dc.subjectcircular heterodyne interferometeren_US
dc.subjectisotropic materialen_US
dc.subjectbirefringent crystalen_US
dc.subjectFresnel equationsen_US
dc.titleMeasurements of material refractive index with a circular heterodyne interferometeren_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.612480en_US
dc.identifier.journalOptical Measurement Systems for Industrial Inspection IV, Pts 1 and 2en_US
dc.citation.volume5856en_US
dc.citation.spage882en_US
dc.citation.epage892en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000231416400101-
Appears in Collections:Conferences Paper


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