| 標題: | Measurements of material refractive indices using heterodyne interferometry |
| 作者: | Su, DC Lee, JY Hsu, CC Chiu, MH 光電工程學系 Department of Photonics |
| 公開日期: | 2000 |
| 摘要: | The phase difference between s- and p- polarizations of the reflected light from a test material is measured using heterodyne interferometry. The measured data is substituted into the specially derived equations and the refractive index can be calculated. When an absorbing material is tested, a general heterodyne light source is used and two measurement processes should be performed because of its two unknown parameters to be solved. And only one measurement process is performed with a circularly polarized heterodyne light source for testing a non-absorbing material. Because the phase difference can be measured accurately with heterodyne interferometry, its performance is not affected by surrounding light noise. So, it is very stable and has a high resolution. |
| URI: | http://hdl.handle.net/11536/19290 |
| ISBN: | 3-540-67943-X |
| 期刊: | INTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONS |
| 起始頁: | 519 |
| 結束頁: | 526 |
| 顯示於類別: | 會議論文 |

