標題: Measurements of material refractive indices using heterodyne interferometry
作者: Su, DC
Lee, JY
Hsu, CC
Chiu, MH
光電工程學系
Department of Photonics
公開日期: 2000
摘要: The phase difference between s- and p- polarizations of the reflected light from a test material is measured using heterodyne interferometry. The measured data is substituted into the specially derived equations and the refractive index can be calculated. When an absorbing material is tested, a general heterodyne light source is used and two measurement processes should be performed because of its two unknown parameters to be solved. And only one measurement process is performed with a circularly polarized heterodyne light source for testing a non-absorbing material. Because the phase difference can be measured accurately with heterodyne interferometry, its performance is not affected by surrounding light noise. So, it is very stable and has a high resolution.
URI: http://hdl.handle.net/11536/19290
ISBN: 3-540-67943-X
期刊: INTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONS
起始頁: 519
結束頁: 526
Appears in Collections:Conferences Paper