Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lin, HM | en_US |
dc.contributor.author | Yen, CC | en_US |
dc.contributor.author | Shih, CH | en_US |
dc.contributor.author | Jou, JY | en_US |
dc.date.accessioned | 2014-12-08T15:25:40Z | - |
dc.date.available | 2014-12-08T15:25:40Z | - |
dc.date.issued | 2004 | en_US |
dc.identifier.isbn | 0-7803-8175-0 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/18095 | - |
dc.description.abstract | In this paper, we employ a monitor-based approach for on-chip bus (OCB) compliance test. To describe the OCB protocols, we propose a FSM model, which can help to extract the necessary properties systematically and verify the data part of a bus transfer efficiently. To demonstrate our methodology, we illustrate two OCB protocols, WISHBONE and AMBA AHB, as the study cases. The experimental results show that we can verify the OCB protocols efficiently and detect the design errors when tests fail. | en_US |
dc.language.iso | en_US | en_US |
dc.title | On compliance test of on-chip bus for SOC | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | ASP-DAC 2004: PROCEEDINGS OF THE ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE | en_US |
dc.citation.spage | 328 | en_US |
dc.citation.epage | 333 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000221356700062 | - |
Appears in Collections: | Conferences Paper |