標題: Study of annealing and exchange bias effects in PtMn based magnetic tunnel junction system
作者: Peng, TY
Yao, YD
Chen, SY
Wang, YH
Chen, WC
Gao, MJ
Tang, DD
材料科學與工程學系
Department of Materials Science and Engineering
公開日期: 2004
摘要: The crystallization structure and thickness of PtMn layer in a magnetic tunnel junction system are important factors to improve its exchange bias effect. This study shows that the PtMn layer could be changed from a FCC (111) structure to a FCT (111) structure after annealing above 270 degreesC. The minimum thickness of PtMn layer is found to be 10 nm for exchange coupling effect to be occurred in our MTJ system. The magnetic exchange effect between PtMn and SAF layers is near 4,300 Oe. Annealing temperatures can be higher than 400 degreesC for samples without patterning; however, temperature at 275 degreesC is too high for samples after patterning. This may be due to the breakdown of edges of the patterned samples as well as the complicated environments around the patterned samples. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
URI: http://hdl.handle.net/11536/18167
http://dx.doi.org/10.1002/pssc.200405519
ISBN: 3-527-40577-1
DOI: 10.1002/pssc.200405519
期刊: SECOND SEEHEIM CONFERENCE ON MAGNETISM, PROCEEDINGS
起始頁: 3628
結束頁: 3631
顯示於類別:會議論文


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