标题: | Study of annealing and exchange bias effects in PtMn based magnetic tunnel junction system |
作者: | Peng, TY Yao, YD Chen, SY Wang, YH Chen, WC Gao, MJ Tang, DD 材料科学与工程学系 Department of Materials Science and Engineering |
公开日期: | 2004 |
摘要: | The crystallization structure and thickness of PtMn layer in a magnetic tunnel junction system are important factors to improve its exchange bias effect. This study shows that the PtMn layer could be changed from a FCC (111) structure to a FCT (111) structure after annealing above 270 degreesC. The minimum thickness of PtMn layer is found to be 10 nm for exchange coupling effect to be occurred in our MTJ system. The magnetic exchange effect between PtMn and SAF layers is near 4,300 Oe. Annealing temperatures can be higher than 400 degreesC for samples without patterning; however, temperature at 275 degreesC is too high for samples after patterning. This may be due to the breakdown of edges of the patterned samples as well as the complicated environments around the patterned samples. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. |
URI: | http://hdl.handle.net/11536/18167 http://dx.doi.org/10.1002/pssc.200405519 |
ISBN: | 3-527-40577-1 |
DOI: | 10.1002/pssc.200405519 |
期刊: | SECOND SEEHEIM CONFERENCE ON MAGNETISM, PROCEEDINGS |
起始页: | 3628 |
结束页: | 3631 |
显示于类别: | Conferences Paper |
文件中的档案:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.