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dc.contributor.authorLIN, YFen_US
dc.contributor.authorSHUNG, CBen_US
dc.date.accessioned2014-12-08T15:03:15Z-
dc.date.available2014-12-08T15:03:15Z-
dc.date.issued1995-07-01en_US
dc.identifier.issn1074-5351en_US
dc.identifier.urihttp://hdl.handle.net/11536/1816-
dc.description.abstractThe shared buffer memory switch (SBMS) architecture was originally proposed as an effective approach to implement ATM switch fabrics. However, in this paper we find that if an error occurs in the address chain memory of one linked list which stores the address of the next cell in the shared buffer memory, the erroneous situation will spread over all linked lists in the SBMS in a short time. In order to prevent the fault spread phenomenon, we propose two doubly linked list based architectures to combat address chain failure; these are referred to as the Flush and In-Seq schemes. The first scheme flushes the remaining cells in the faulty queue but collect their addresses for later usage. The second scheme outputs the remaining cells in their correct sequence. From our simulation, if the error injection rate is low, the performance of the In-Seq scheme experiences slight degradation compared with the error-free situation.en_US
dc.language.isoen_USen_US
dc.subjectATMen_US
dc.subjectBROAD-BAND ISDNen_US
dc.subjectFAULT TOLERANCEen_US
dc.subjectSHARED BUFFER SWITCHen_US
dc.titleSHARED BUFFER ATM SWITCH WITH DOUBLY LINKED LISTSen_US
dc.typeArticleen_US
dc.identifier.journalINTERNATIONAL JOURNAL OF COMMUNICATION SYSTEMSen_US
dc.citation.volume8en_US
dc.citation.issue4en_US
dc.citation.spage253en_US
dc.citation.epage265en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1995RT76600003-
dc.citation.woscount0-
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